Magnetic Microscopy was initially developed to localize with precision the short circuits in electronic components. Neocera then developed the technique further to identify resistive opens: defects which involve a partial opening of the circuit.
Research is now underway to extend the use of Magnetic Microscopy to the localization of full opens. This is an exciting project, as no technique has yet been able to localize complete opens in 2D and 3D components with adequate resolution. By increasing the maximum frequency in its detecting chain, Magnetic Microscopy will be able to visualize open circuits with a precision of less than 50 microns. This increased capability, initially developed by Neocera, will be fine-tuned and validated by Intraspec Technologies, so that its performance and applicability to a range of different components can be assured.